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一位QCA数值比较器的可靠性研究
引用本文:黄宏图,蔡理,彭卫东,柏鹏,杨晓阔,李政操. 一位QCA数值比较器的可靠性研究[J]. 微纳电子技术, 2011, 48(5): 291-295. DOI: 10.3969/j.issn.1671-4776.2011.05.003
作者姓名:黄宏图  蔡理  彭卫东  柏鹏  杨晓阔  李政操
作者单位:1. 空军工程大学理学院,西安,710051
2. 空军工程大学综合电子信息系统研究中心,西安,710051
基金项目:陕西省电子信息系统综合集成重点实验室基金(201115Y15)
摘    要:针对量子元胞自动机电路中存在的元胞移位、元胞未对准、元胞遗漏、元胞旋转等固有缺陷,采用概率转移矩阵方法建立了一位QCA数值比较器的可靠性模型,并对其可靠性进行了深入分析。对于不同的输入,分别比较了各组成元件在同样的故障概率水平下对整体可靠性(正确输出的概率)的不同影响。仿真结果表明,在所有的输入情况下传输线始终是影响其可靠性的主要因素,从而确定了传输线在该数值比较器中的重要性,进而为大规模QCA数值比较器的设计以及可靠性的提高提供了依据。

关 键 词:概率转移矩阵  电路分割  量子元胞自动机  数值比较器  可靠性

Reliability Study of 1-bit QCA Comparators
Huang Hongtu,Cai Li,Peng Weidong,Bai Peng,Yang Xiaokuo,Li Zhengcao. Reliability Study of 1-bit QCA Comparators[J]. Micronanoelectronic Technology, 2011, 48(5): 291-295. DOI: 10.3969/j.issn.1671-4776.2011.05.003
Authors:Huang Hongtu  Cai Li  Peng Weidong  Bai Peng  Yang Xiaokuo  Li Zhengcao
Affiliation:Huang Hongtua,Cai Lia,Peng Weidongb,Bai Pengb,Yang Xiaokuoa,Li Zhengcaoa(a.College of Science,b.The Research Center of Electronic Information System Integration,Air Force Engineering University,Xi'an 710051,China)
Abstract:Due to the inherent defects in the QCA circuit,such as the cell displacement,cell misalignment,cell omission,cell rotation and so on,the reliability model of 1-bit QCA comparators was set up through the probabilistic transfer matrix method and its reliability was deeply analyzed.For different inputs,the effect of the individual components on the probability of correct output was compared according to their probability of failure at the same level.The simulation result shows that the wire is the major factor...
Keywords:probabilistic transfer matrix  circuit partition  quantum-dot cellular automata  comparator  reliability  
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