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边界扫描测试向量生成的抗混迭算法
引用本文:胡政,黎琼炜.边界扫描测试向量生成的抗混迭算法[J].电子测量技术,1998(1):8-12.
作者姓名:胡政  黎琼炜
作者单位:国防科技大学,国防科技大学,国防科技大学
摘    要:文中在分析改良计数算法和移位“1”算法的基础上,提出了一种新型的边界扫找测试向量生成算法-等权值算法。该算法实现了测试向量集的紧凑性与故障分辨力之间合理的折衷,是一种性能优良的测试向量生成算法,它具备抗征兆混迭的故障诊断能力,测试时间的数量级为O(Nlog(N)。

关 键 词:边界扫描  板级测试  测试生成  IC  集成电路

An Anti-aliasing Test Generation Algorithm of Boundary-Scan Board-level Test
Hu Zheng Li Qiongwei Wen Xisen.An Anti-aliasing Test Generation Algorithm of Boundary-Scan Board-level Test[J].Electronic Measurement Technology,1998(1):8-12.
Authors:Hu Zheng Li Qiongwei Wen Xisen
Affiliation:Hu Zheng Li Qiongwei Wen Xisen
Abstract:In this paper,at first, we discuss the performance of some test generation algorithms in Boundary-Scan board-level test,such as Modified Counting Sequence Algorithm and Walking One's Algorithm. Then we propose a new algorithm, called Equal Weight Algorithm. The new algorithm can generate test vector set nearly as compact as that of Modified Counting Sequence Algorithm,but has much better diagnosis capacity. It can eliminate aliasing fault syndrome,so it is also called Anti-Aliasing Algorithm.
Keywords:Boundary-Scan Board-level Test Test Generation  
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