| 消光法测量微粒尺寸的测量下限的研究 |
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| 引用本文： | 郑刚,蔡小舒,卫敬明,王乃宁. 消光法测量微粒尺寸的测量下限的研究[J]. 仪器仪表学报, 1998, 19(5): 503-507 |
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| 作者姓名： | 郑刚 蔡小舒 卫敬明 王乃宁 |
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| 作者单位： | 上海理工大学仪表学院,上海,200093 |
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| 摘 要： | 根据Ｍｉｅ光散射理论，本文详细讨论了用可见光波段的光透消光法（Ｌｉｇｈｔｅｘｔｉｎｃｔｉｏｎ）测量微粒尺寸的测粒下限。分析及计算表明，采用合适的最优化计算方法，光透消光法可用于测量亚微米级及以下的超细颗粒。文中给出了数值模拟计算结果及实测结果。
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| 关 键 词： | 光透消光法 测量下限 微粒尺寸 |
A Study on Measurement Lower-limit of Particle Sizerwith Light Extinction |
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| Zheng Gang,Cai Xiaoshu,Wei jingming,Wang Naining. A Study on Measurement Lower-limit of Particle Sizerwith Light Extinction[J]. Chinese Journal of Scientific Instrument, 1998, 19(5): 503-507 |
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| Authors: | Zheng Gang Cai Xiaoshu Wei jingming Wang Naining |
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| Affiliation: | Dept.of Instruments University of Shanghai for Science and Technology Shanghai 200093 |
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| Abstract: | In this paper,A study of measurement lower limit of particle sizer using multi wavelength light extinction is proposed.Analysis and computer numerical simulation demonstrate that submicrometer and nanometer particle can be measured by light extinction particle sizer using multi wavelength.Experiment results are also gived in the paper. |
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| Keywords: | Light extinction Measurement lower limit Particle size. |
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