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Stress imagining of semiconductor surface by tip-enhanced Raman spectroscopy |
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| Authors: | Y. SAITO,M. MOTOHASHI,N. HAYAZAWA&Dagger ,& S. KAWATA&dagger &Dagger |
| Affiliation: | RIKEN (The Institute of Physical and Chemical Research), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan;Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan;CREST, Japan Corporation of Science and Technology, Saitama 332-0012, Japan |
| Abstract: | |
| Keywords: | Apertureless probe metallized tip near field SERS strained silicon surface-enhanced Raman spectroscopy TERS tip-enhanced Raman spectroscopy |