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Room temperature indium tin oxide by XeCl excimer laser annealing for flexible display
Authors:Wonsuk Chung   Michael O. Thompson   Paul Wickboldt   Daniel Toet  Paul G. Carey
Affiliation:

a Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14850, USA

b FlexICs, Inc., 165 Topaz Street, Milpitas, CA 95035, USA

Abstract:A XeCl excimer laser (λ=308 nm) has been used to anneal Indium Tin Oxide (ITO) films deposited at 25 °C using DC magnetron sputtering. With increasing laser fluence, the film crystallinity was improved while retaining the as-deposited 111 texture. As a result of laser irradiation, the sheet resistance of 100 nm ITO films decreased from 191 Ω/□ (1.91×10−3 Ω cm) to 25 Ω/□ (2.5×10−4 Ω cm), while the optical transmittance in the visible range increased from 70% to more than 85%. Surface roughness and etching properties were also significantly improved following laser annealing.
Keywords:Indium tin oxide   Excimer laser   Annealing
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