a Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14850, USA
b FlexICs, Inc., 165 Topaz Street, Milpitas, CA 95035, USA
Abstract:
A XeCl excimer laser (λ=308 nm) has been used to anneal Indium Tin Oxide (ITO) films deposited at 25 °C using DC magnetron sputtering. With increasing laser fluence, the film crystallinity was improved while retaining the as-deposited 111 texture. As a result of laser irradiation, the sheet resistance of 100 nm ITO films decreased from 191 Ω/□ (1.91×10−3 Ω cm) to 25 Ω/□ (2.5×10−4 Ω cm), while the optical transmittance in the visible range increased from 70% to more than 85%. Surface roughness and etching properties were also significantly improved following laser annealing.