A CCD area detector for X-ray diffraction under high pressure for rotating anode source

Details of a two-dimensional X-ray area detector developed using a charge coupled device, a image intensifier and a fibre optic taper are given. The detector system is especially optimized for angle dispersive X-ray diffraction set up using rotating anode generator as X-ray source. The performance of this detector was tested by successfully carrying out powder X-ray diffraction measurements on various materials such as intermetallics AuIn₂, AuGa₂, high Z material Pd and low Z scatterer adamantane (C₁₀H₁₆) at ambient conditions. Its utility for quick detection of phase transitions at high pressures with diamond anvil cell is demonstrated by reproducing the known pressure induced structural transitions in RbI, KI and a new structural phase transition in AuGa₂ above 10 GPa. Various softwares have also been developed to analyze data from this detector. Paper presented at the 5th IUMRS ICA98, October 1998, Bangalore