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Interface behaviour evaluation in Au/Cr,Au/Ti and Au/Pd/Ti thin films by means of resistivity and stylus measurements |
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| Authors: | R. Audino G. Destefanis F. Gorgellino E. Pollino S. Tamagno |
| Affiliation: | Centro Studi e Laboratori Telecomunicazioni, via Reiss Romoli 274, 10148 Torino, Italy |
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