Diffusing‐Wave Spectroscopy Contribution to Strain Analysis

Abstract: We present a new full‐field strain measurement method based on diffusing‐wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light‐scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10^?5–10^?3. To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non‐scattering materials.