|
|||||
|
|
The calculation of carrier concentrations in silicon in the medium and high temperature regions |
|
| Authors: | E.L. Heasell |
| Affiliation: | Electrical Engineering Dept., University of Waterloo, Waterloo, Ontario, Canada |
| Abstract: | |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |