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Bridging the gap between conventional and video-speed scanning probe microscopes
Authors:A.J. Fleming  B.J. Kenton  K.K. Leang
Affiliation:1. School of Electrical Engineering and Computer Science, University of Newcastle, Callaghan, NSW 2308, Australia;2. Department of Mechanical Engineering, University of Nevada—Reno, Reno, NV 89557-0312, USA
Abstract:
A major disadvantage of scanning probe microscopy is the slow speed of image acquisition, typically less than one image per minute. This paper describes three techniques that can be used to increase the speed of a conventional scanning probe microscope by greater than one hundred times. This is achieved by the combination of high-speed vertical positioning, sinusoidal scanning, and high-speed image acquisition. These techniques are simple, low-cost, and can be applied to many conventional microscopes without significant modification. Experimental results demonstrate an increased scan rate from 1 to 200 Hz. This reduces the acquisition time for a 200×200 resolution image from 3 min to 1 s.
Keywords:Tip scanning instrument design and characterization   Scanning tunneling microscopy (STM)   Atomic force microscopy (AFM)
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