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Scanning transmission X-ray microscopy with a fast framing pixel detector
Authors:A. Menzel  C.M. Kewish  P. Kraft  B. Henrich  K. Jefimovs  J. Vila-Comamala  C. David  M. Dierolf  P. Thibault  F. Pfeiffer  O. Bunk
Affiliation:1. Paul Scherrer Institut, 5232 Villigen PSI, Switzerland;2. Synchrotron SOLEIL, L''Orme des Merisiers, BP 48, Saint Aubin, 91192 Gif sur Yvette, France;3. EMPA, 8600 Dübendorf, Switzerland;4. Department Physik (E17), Technische Universität München, 85748 Garching, Germany
Abstract:
Scanning transmission X-ray microscopy (STXM) is a powerful imaging technique, in which a small X-ray probe is raster scanned across a specimen. Complete knowledge of the complex-valued transmission function of the specimen can be gained using detection schemes whose every-day use, however, is often hindered by the need of specialized configured detectors or by slow or noisy readout of area detectors. We report on sub-50 nm-resolution STXM studies in the hard X-ray regime using the PILATUS, a fully pixelated fast framing detector operated in single-photon counting mode. We demonstrate a range of imaging modes, including phase contrast and dark-field imaging.
Keywords:Scanning transmission X-ray microscopy   Phase contrast   X-ray microscopy
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