Scanning transmission X-ray microscopy with a fast framing pixel detector |
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Authors: | A. Menzel C.M. Kewish P. Kraft B. Henrich K. Jefimovs J. Vila-Comamala C. David M. Dierolf P. Thibault F. Pfeiffer O. Bunk |
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Affiliation: | 1. Paul Scherrer Institut, 5232 Villigen PSI, Switzerland;2. Synchrotron SOLEIL, L''Orme des Merisiers, BP 48, Saint Aubin, 91192 Gif sur Yvette, France;3. EMPA, 8600 Dübendorf, Switzerland;4. Department Physik (E17), Technische Universität München, 85748 Garching, Germany |
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Abstract: | ![]() Scanning transmission X-ray microscopy (STXM) is a powerful imaging technique, in which a small X-ray probe is raster scanned across a specimen. Complete knowledge of the complex-valued transmission function of the specimen can be gained using detection schemes whose every-day use, however, is often hindered by the need of specialized configured detectors or by slow or noisy readout of area detectors. We report on sub-50 nm-resolution STXM studies in the hard X-ray regime using the PILATUS, a fully pixelated fast framing detector operated in single-photon counting mode. We demonstrate a range of imaging modes, including phase contrast and dark-field imaging. |
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Keywords: | Scanning transmission X-ray microscopy Phase contrast X-ray microscopy |
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