Reliability of low-cost CdS/Cu2S solar cells |
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Authors: | Sayed M.M. Partain L.D. |
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Affiliation: | Hewlett-Packard Co., Microwave Division, Palo Alto, USA; |
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Abstract: | Accelerated life tests show that CdS/Cu2S solar-cell lifetimes increase with lower temperature, cyclic light and a nitrogen-gas ambient. A normal Arrhenius type of temperature dependence was found. Extrapolated lifetime for cells kept below 50°C in nitrogen gas with earth deployment exceeded twenty years. The probable decay mechanisms are thermal diffusion, formation of recombination centres and voltage-induced decomposition. |
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