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ZnO纳米晶粉末和电沉积Ni薄层透射电镜样品的制备和观察
引用本文:李慧,张静武,秦秀娟. ZnO纳米晶粉末和电沉积Ni薄层透射电镜样品的制备和观察[J]. 理化检验(物理分册), 2001, 37(8): 362-364
作者姓名:李慧  张静武  秦秀娟
作者单位:燕山大学材料与化工学院,;燕山大学材料与化工学院,;燕山大学材料与化工学院,
摘    要:制备了ZnO纳米晶粉末和电沉积Ni镀层的透射电子显微镜样品,并利用透射电子显微镜对其进行了观察。

关 键 词:透射电镜  粉末样品  金属薄膜样品
文章编号:1001-4012(2001)08-0362-02
修稿时间:2001-03-09

TEM SAMPLE PREPARATION AND EXAMINATION OF NANOPOWDER AND DEPOSITED NICKEL THIN FILM
LI Hui,ZHANG Jing-wu,QIN Xiu-juan. TEM SAMPLE PREPARATION AND EXAMINATION OF NANOPOWDER AND DEPOSITED NICKEL THIN FILM[J]. Physical Testing and Chemical Analysis Part A:Physical Testing, 2001, 37(8): 362-364
Authors:LI Hui  ZHANG Jing-wu  QIN Xiu-juan
Abstract:TEM samples of nanometer crystalline ZnO powders and electro-deposited Ni coating have been prepared. TEM samples were observed by means of transmission electron microscope.
Keywords:TEM  Powders sample  Metallic thin film sample  
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