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Characterization of a 0.13 μm CMOS Link Chip using Time Resolved Emission (TRE)
Authors:Franco Stellari   Peilin Song   John Hryckowian   Otto A. Torreiter   Steve Wilson   Phil Wu  Alberto Tosi
Affiliation:aIBM, T.J. Watson Research Center, Yorktown Heights, NY;bIBM Server and Technology Group, Poughkeepsie, NY;cIBM Server and Technology Group, Boeblingen, Germany;dPolitecnico di Milano, Milan, Italy
Abstract:The Picosecond Imaging Circuit Analysis (PICA) technique using the Superconducting Single-Photon Detector (SSPD) allows the detailed characterization of pulse width variations along the delay chain of a high speed Self Timing Interface (STI). Pulses gradually shrink and finally disappear along the delay chain.
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