| 同步时序电路中组合冗余故障识别技术 |
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| 引用本文： | 郭希维,苏群星,谷宏强.同步时序电路中组合冗余故障识别技术[J].兵工自动化,2007,26(2):83-85. |
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| 作者姓名： | 郭希维 苏群星 谷宏强 |
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| 作者单位： | 军械工程学院,导弹工程系,河北,石家庄,050003;军械工程学院,导弹工程系,河北,石家庄,050003;军械工程学院,导弹工程系,河北,石家庄,050003 |
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| 摘 要： | 对时序电路的迭代逻辑阵列(ILA)施加组合ATPG(自动测试模式生成),可得到不可测故障识别的定理和条件,其条件针对故障电路给出.基于无故障电路的条件,其验证过程用状态图表示.并用ILA识别不可测故障均为组合冗余故障,而组合冗余故障可用长度为1的ILA实现.故可由此简化不可测故障的识别过程.并通过时序电路中的组合冗余故障识别以验证.
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| 关 键 词： | 不可测故障 组合冗余 迭代逻辑阵列 自动测试模式生成 |
| 文章编号： | 1006-1576（2007）02-0083-03 |
| 收稿时间： | 2006-09-25 |
| 修稿时间： | 2006-12-09 |
Technologies of Combinational Redundant Faults Identification in Synchronous Circuits |
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| GUO Xi-wei,SU Qun-xing,GU Hong-qiang.Technologies of Combinational Redundant Faults Identification in Synchronous Circuits[J].Ordnance Industry Automation,2007,26(2):83-85. |
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| Authors: | GUO Xi-wei SU Qun-xing GU Hong-qiang |
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| Affiliation: | Dept. of Missile Engineering, Ordnance Engineering College, Shijiazhuang 050003, China |
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| Abstract: | The theorem and conditions on identifying undetectable faults can be acquired by applying combinational ATPG to ILA in sequential circuits; and the conditions are given for faulty circuit. The conditions on fault-free circuit are researched, and it can be described by state-diagram. The undetectable faults identified by ILA are all combinational redundant faults, and they can be identified by ILA of length one. So the method simplifies the process of identifying undetectable faults. At last, the example in sequential circuits is given to verify the method. |
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| Keywords: | Undetectable faults Combinational redundancy ILA ATPG |
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