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基于多信号流图的电子设备故障传播建模技术研究
引用本文:李宝晨,黄考利,孙健,连光耀.基于多信号流图的电子设备故障传播建模技术研究[J].计算机测量与控制,2012,20(9):2389-2392.
作者姓名:李宝晨  黄考利  孙健  连光耀
作者单位:1. 军械工程学院,石家庄,050003
2. 军械技术研究所,石家庄,050003
摘    要:针对当前缺乏对电子设备故障传播规律研究的现状,将功能参数引入多信号流图模型,根据对功能模块的影响程度,给出了不同的故障类型表达式.引入SI传染病模型,并对其进行改进后应用于电子设备故障传播建模技术,基于多信号流图建立了基本的和带环境因素的故障传播模型,并利用Lyapunov函数证明了故障传播的稳定条件.通过实验仿真得到了与实际贴近的故障传播模型,该模型可有效对复杂电子设备故障发生趋势进行预测,并为后续测试性设计和故障注入技术的研究奠定了理论基础.

关 键 词:测试性设计  多信号流图  改进SI模型  随机扰动

Study on Regular of Failure Transmitting Based on Multiple Signal Flow Graph
Li Baochen , Huang Kaoli , Sun Jian , Lian Guangyao.Study on Regular of Failure Transmitting Based on Multiple Signal Flow Graph[J].Computer Measurement & Control,2012,20(9):2389-2392.
Authors:Li Baochen  Huang Kaoli  Sun Jian  Lian Guangyao
Affiliation:1.Ordnance Engineering College,Shijiazhaung 050003,China; 2.Ordnance Technological Research Institute,Shijiazhuang 050003,China)
Abstract:In point of the lacking study of the failure transmitting of electronic equipment,the formulas of leading function figure to multiple signal flow graph model.On the basis of the extent to which the function figure influences functions and combined with the similarity between infection and failure transmitting.We improve the SI model and propose the basic transmitting model and the one with environment factor.We get the failure transmit ting’s trends of development through simulation which is proved to be close fact,and this makes the theoretical foundation for future optimization of design for testability.
Keywords:design for testability  multiple signal flow graph  SI  random disturb
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