首页 | 本学科首页   官方微博 | 高级检索  
     

Improvements on voltage-resistant performance of bipolar static induction transistor (BSIT) with buried gate structure
作者姓名:WANG YongShun  FENG JingJing  LIU ChunJuan  WANG ZiTing  WANG ZaiXing  ZHANG CaiZhen
作者单位:School of Electronic and Information Engineering, Lanzhou Jiaotong University, Lanzhou 730070, China
基金项目:This project was supported by Scientific and Technological Supporting Program of Gansu Province (Grant No. 097GKCA052).
摘    要:

关 键 词:静电感应晶体管  BSIT  器件性能  双极型  耐电压  栅结构  击穿电压  阻断电压

Improvements on voltage-resistant performance of bipolar static induction transistor (BSIT) with buried gate structure
WANG YongShun,FENG JingJing,LIU ChunJuan,WANG ZiTing,WANG ZaiXing,ZHANG CaiZhen.Improvements on voltage-resistant performance of bipolar static induction transistor (BSIT) with buried gate structure[J].SCIENCE CHINA Information Sciences,2012(4):962-970.
Abstract:
Keywords:bipolar static induction transistor  voltage-resistant capability  punch-through  deep trench
本文献已被 维普 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号