| Abstract: | This article presents accurate measurement-based models derived from measured S-parameters of passive circuit elements which include inductors, thin-film resistors, interdigital and MIM capacitors, via holes, and airbridges for use in the computer-aided design of monolithic microwave integrated circuits (MMICs). The thru-reflect-line (TRL) calibration method is employed to accurately measure the S-parameters of the passive elements. Some of the models are scalable for different substrate thicknesses and substrate dielectric constant values as they are based on microstrip line theory. © 1994 John Wiley & Sons, Inc. |
