Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

Authors:	V Körstgens R Meier M A Ruderer S Guo H-Y Chiang J Perlich S V Roth R Gehrke P Müller-Buschbaum

Affiliation:	Technische Universita?t Mu?nchen, Physik-Department, Lehrstuhl fu?r Funktionelle Materialien, James-Franck-Str. 1, 85748 Garching, Germany.

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