Effect of ultrasonic frequency on electrochemical Si etching in porous Si layer transfer process for thin film solar cell fabrication |
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Authors: | Ju-Young LeeWone-Keun Han Jae-Ho Lee |
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Affiliation: | a Department of Materials Science and Engineering, Hongik University, 72-1 Sangsu-dong, Mapo-gu, Seoul 121-791, Republic of Korea b Department of Science, Hongik University, 72-1 Sangsu-dong, Mapo-gu, Seoul 121-791, Republic of Korea |
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Abstract: | A porous Si (PS) layer transfer process that monocrystalline Si film grown on a Si substrate wafer is separated with the substrate and transferred to a non-Si device realizes to get monocrystalline Si film on low-cost substrates such as glass. PS film is fabricated by electrochemical etching in a chemical mixture of HF and ethanol. Effect of ultrasonic frequency on surface morphology of PS film is studied. By applying ultrasonic waves during etching, the pores on PS film with uniform size can be fabricated. |
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Keywords: | Porous silicon Electrochemical etching Layer transfer Ultrasonic |
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