IBLC effect leading to colossal dielectric constant in layered structured Eu2CuO4 ceramic

Dielectric (ε_r′) studies of phase pure T′-type Eu₂CuO₄ ceramics of two markedly different grain sizes (D), prepared by (i) conventional powder mixing and (ii) citrate complexation-Pechini process, have been carried out in the frequency range 0.1 Hz to 1 MHz, and at temperatures −100 °C to 150 °C. ε_r′ is found to be highly grain size dependent. For the sample with coarse bar-like grains (D²~17×6 μm²) ε_r′ is >10³, and for the finer grain size sample with bimodal distribution (D₁~1 μm, D₂~3 μm) ε_r′ is ~10⁵; for both the samples, high ε_r′ value is nearly frequency independent over 500 Hz≤f<100 kHz and T≥30 °C. The impedance spectroscopy (IS) study has clearly shown that both, the coarse- and the fine-grained samples consist of semiconducting grains and insulating grain boundaries that primarily lead to an internal barrier layer capacitance (IBLC) effect. And thus, manifest colossal dielectric constant (ε_r′>10³) in Eu₂CuO₄ ceramics. The smaller grain size (Pechini) sample, with over an order higher number of grains and grain boundary network, showing over an order higher ε_r′ (~10⁵) compared to the coarse grained one, further endorses the IBLC effect.