Application of Inverted Strip Dielectric Waveguides for Measurement of the Dielectric Constant of Low-Loss Materials at Millimeter-Wave Frequencies

An entirely new method for measuring dielectric properties of slab-type materials is developed by using a novel dielectric waveguide structure originally designed for millimeter-wave integrated circuits. The method entails the measurement of the stopband of the grating structure created in the dielectric waveguide. Several examples of measurement results are reported.