| GLOBAL: A Design for Random Testability Algorithm |
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| 作者姓名： | Xiang Dong Wei Daozheng |
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| 作者单位： | CAD Lab.，Institute of Computing Technology，Chinese Academy Of Sciences，Beijing 100080 |
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| 摘 要： | 1MotivationsIncreasingdensityofVLSIchipsmakesthecostoftestingveryexpensive.Designfortestabilitycantemperthisproblemdrastically.Therearetwokindsofsolutions:(i)localsolutionl3'2]withlowcomputingcomplexity,whichcannotalwaysgetsatisfactoryresults;(ii)globa.lsolutionwithprohibitivecomputingcomplekityl1'5].T.H.Chen'andM.A.Breuer1lpresentedanILPmodeltoplacetestpointsglobally.Becauseofitscomputingcomplealty,1lcanonlydealwithsmallormediumscalecircuits.SCOAPisusedin1],whichisnotaveryaccuratet…
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| 关 键 词： | 计算机图形学 整体算法 曲面交叉线 |
GLOBAL: A design for random testability algorithm |
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| Xiang Dong,Wei Daozheng.GLOBAL: A Design for Random Testability Algorithm[J].Journal of Computer Science and Technology,1994,9(2):182-192. |
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| Authors: | Dong Xiang Daozheng Wei |
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| Affiliation: | CAD Lab.; Institute of Computing Technology; Chinese Academy Of Sciences; Beijing 100080; |
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| Abstract: | A global design for testability algorithm is offered in this paper. First, a test point candidate set is obtained to simplify the test point placemellt problem; the principle of selective tracing is offered to get a sequential test point placement solution, which is used as the initial solution of the global algorithm. Using this initial value, a branch & bound algorithm is then offered to obtain a global design for testability solution. Finally,a new test length analyser is offered to evaluate the global design for testability. |
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| Keywords: | Test point testability test length design for testability |
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