A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopy |
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Authors: | Piétrement O. Beaudoin J.L. Troyon M. |
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Affiliation: | (1) Unité de Thermique et Analyse Physique, EA 2061, Université de Reims, 21, rue Clément Ader, 51685 Reims Cedex 2, France |
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Abstract: | We describe a new calibration method for lateral contact stiffness using modulated lateral force microscopy, a technique that offers some advantages with respect to the more classical friction force microscopy currently used for characterizing the friction properties of materials. The calibration method is based on the study of the lateral contact stiffness versus applied load and on the use of elasticity contact theories to determine by fit the calibration coefficient, allowing the scaling of experimental data. The method is tested by measuring the friction coefficient and shear strength of silicon and mica samples, respectively, and compared with results from the literature. This revised version was published online in August 2006 with corrections to the Cover Date. |
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Keywords: | scanning force microscopy lateral force modulation contact stiffness elasticity friction |
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