| 提高线性CCD测量水平的分析研究 |
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| 引用本文： | 胡丽,宋文爱.提高线性CCD测量水平的分析研究[J].山西电子技术,2011(5):83-84,89. |
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| 作者姓名： | 胡丽 宋文爱 |
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| 作者单位： | 中北大学信息与通信工程学院; |
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| 摘 要： | 为了提高线性CCD测量系统的测量精度,从影响系统的几个主要方面进行了分析研究,并提出相关的改善措施。除了详细论述了线性CCD传感器、光源成像系统、A/D转换器等器件系统外,还分析研究了信息采集、驱动电路设计方法和图像处理的软件算法。对CCD图像的噪声组成进行了较完整的分析,给出了其噪声的详细分类;根据各噪声的特点,提出了相应的噪声处理技术。
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| 关 键 词： | 线性CCD 相关双采样 暗电流噪声 |
Research on the Accuracy Improvement of Linear Array CCD Measuring System |
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| Hu Li,Song Wen-ai.Research on the Accuracy Improvement of Linear Array CCD Measuring System[J].Shanxi Electronic Technology,2011(5):83-84,89. |
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| Authors: | Hu Li Song Wen-ai |
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| Affiliation: | Hu Li,Song Wen-ai(School of Information and Communication Engineering,North University of China,Taiyuan Shanxi 030051,China) |
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| Abstract: | In order to improve the accuracy of linear array CCD measuring system,the research is made on several important factors that affect the system accuracy and the relevant improving measures are brought out.Along with the detailed discussion on the instrument system such as linear CCD sensor,the light imaging system and the A/D convertor,the research is also done on the information gathering,driving circuit designing and software arithmetic of image processing.The noise composition in CCD image is analyzed acc... |
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| Keywords: | linear array CCD correlated double sampling dark current noise |
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