Microstructural features of Cd0·8Zn0·2Te thin films studied by X-ray diffraction and electron microscopy

Thin films of synthesized Cd_0·8Zn_0·2Te have been deposited on glass substrate at different substrate temperatures. Different microstructural parameters like crystallite size, rms strain, dislocation density, stacking fault probability and stacking fault energy are determined by XRD, SEM, TEM and TED. XRD and XPS have been used to determine the composition. Variations of the microstructural parameters with film thickness and substrate temperature have been studied in order to obtain optimum growth condition for maximum particle size and least microstructural defects. An effort has been made to correlate the experimental results.