Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems |
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Authors: | Hans G. Kerkhoff and Hans P.A. Hendriks |
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Affiliation: | (1) MESA+ Research Institute, Testable Design and Test of Microsystems (TDT) Group, P.O. Box 217, 7500, AE, Enschede, The Netherlands |
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Abstract: | Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include massive parallel DNA analysis and automatic drug synthesis. Until now, only functional testing has been used to guarantee the quality of micro-fluidic systems after manufacturing.In this paper, defect-oriented test approaches developed in analogue fault modeling and simulation have been used to predict for the first time the faulty behavior of micro-electronic fluidic microsystems. The modeling is targeted for use in complex electronic/fluidic microsystems employing commercial microsystem CAD tools. It enables a measure for the quality of these systems based on the performed (functional) tests and can be a guide for future test-stimuli generation and yield prediction. |
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Keywords: | microsystem testing analogue fault modeling analogue fault simulation fluidic FEM simulation defect-oriented testing |
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