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XPS Studies of Chemical States of NiO/NiFe Interface |
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| Authors: | Guanghua Yu Chunlin Chai Fengwu Zhu |
| Abstract: | |
| Keywords: | chemical states exchange coupling field Hex coercivity Hc X-ray photoelectron spectroscopy (XPS) |
| 本文献已被 CNKI 万方数据 等数据库收录！ | |
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