浅谈两台IC分选机并行测试方法

随着半导体行业测试技术不断提高,IC分选机技术不断升级,昂贵的集成电路测试设备是导致集成电路测试成本偏高的主要因素。如何最有效地使用好现有设备,充分利用设备资源,降低测试成本,提高测试效率,是工程技术人员需要探索的问题。从如何实现两台IC分选机并行测试展开具体的说明,详细介绍两台IC分选机与测试系统并行测试的通信原理,以及实际工作中的一些注意事项,避免出现质量事故,并通过试验说明并行测试的优越性。

Parallel Test Method on Two IC Handler

As the semiconductor industry to test technology continues to improve, IC handler technology upgrading, integrated circuit and expensive test equipment are the main factors to cause the IC test cost is high. How to use the existing equipment most effectively, make full use of equipment resources, reduce the cost of testing, improve the testing efficiency, engineering and technical personnel need to explore the issue. The paper introduces how to realize the two IC handler parallel test launches the specific details, details of communication principle two IC handler and testing system of parallel testing, as well as the actual work in some matters needing attention, avoid quality accident, and the results were explained and superiority for testing.