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基于功能分析的分布式BIT设计
引用本文:朱玉祜.基于功能分析的分布式BIT设计[J].测控技术,2017,36(12):150-153.
作者姓名:朱玉祜
作者单位:中国航空工业集团公司洛阳电光设备研究所,河南洛阳,471009
摘    要:基于功能分析的分布式BIT设计方法是针对在产品设计初期,测试性定性及定量要求不明确,与测试性设计相关的可靠性、维修性数据缺乏提出的.这种方法的核心是通过分析产品功能,确定产品故障模式与测试方法,进而建立测试性模型,得出最优的测试性设计.为了验证所提出的方法,以具体工程应用为实例,对设计的过程做出了详细介绍.

关 键 词:功能分析  分布式  BIT  测试性  模型

Distributed BIT Design Based on Function Analysis
Abstract:A distributed BIT design method based on functional analysis is proposed for situations that the qualitative and quantitative requirements of testability are not clear as well as the reliability and maintainability data related to testability design are lacking at the initial stage of the product design.The key of this method is to analyze the product function and confirm the product failure mode and its test method,then to establish the testability model,and finally to acquire the best testability design.To verify the proposed method,the specific design process is introduced with concrete engineering application as an example.
Keywords:function analysis  distributed  BIT  testability  model
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