VLSI版图参数提取的分布式并行算法

在用边界元法提取版图参数时，经常会遇到非均匀介质的情况。对这类问题若直接用传统的边界元分区方法求解，处理起来比较麻烦，尤其当非均匀性较严重时，边界元法计算简单方便、速度快的优点会大大削弱。针对这一现象。本文提出了边界元分区问题的分布式并行算法。将它用于一个由天台工作站组成的分布式环境中对ＶＬＳＩ版图参数进行提取，运行时间比传统方法明显减少，证明该算法加快了求解的速度，具有并行、高效的特点，取得了良

A Distributed Parallel Algorithm for VLSI Layout Parameter Extraction

The situation of non uniform material may often appear when we extract VLSI layout parameters using Boundary Element Method (BEM).It is difficult to deal with this problem by using traditional region division method of BEM.Particularly if there is lot of material in the region concerned,the advantages of BEM such as simplicity,convenience and rapidity will be weakened.In this paper the authors present a distributed algorithm for region division problem of BEM.The algorithm is implemented in a distributed system consisting of 3 Workstations to extract VLSI layout parameters.The results obtained show that the calculating time of this distributed algorithm is less than that of traditional methods.This demonstrates that the algorithm can speed up the calculation and is characterized by parallel operation and high efficiency.