| 一种威布尔寿命分布模型 |
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| 引用本文： | 宋世斌. 一种威布尔寿命分布模型[J]. 电子产品可靠性与环境试验, 2001, 0(1): 7-9 |
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| 作者姓名： | 宋世斌 |
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| 作者单位： | 中山大学统计科学系, |
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| 摘 要： | 给出了一种产品的长记忆寿命模型 ,推导出产品寿命的威布尔分布特性 ,对产品寿命试验的设计、分析、仿真有一定的应用价值
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| 关 键 词： | 产品寿命分布 长记忆 加速寿命试验 |
| 修稿时间： | 2000-10-18 |
A Model of the Weibull Life Distributions |
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| SONG Shi-bin. A Model of the Weibull Life Distributions[J]. Electronic Product Reliability and Environmental Testing, 2001, 0(1): 7-9 |
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| Authors: | SONG Shi-bin |
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| Abstract: | We present a model of long range dependent product life and deduce the characteristics of Weibull life distributions. The results are helpful for the design, analysis and simulation of product life testing. |
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| Keywords: | product life distribution long-range dependence accelerated life test |
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