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Preparation and characterisation of high surface area semiconducting oxides
Authors:A. C. C. Tseung  H. L. Bevan
Affiliation:(1) Department of Chemistry, The City University, London, EC1, UK
Abstract:
The conventional method of preparing doped semiconducting oxides involves solid state sintering at elevated temperatures and the resultant products have a very low surface area (< 1 m2 g–1). This severely limits the activity of semiconducting oxide catalysts, such as lithiated NiO. A cryochemical method based on the freeze drying of mixed salt solutions, followed by low temperature calcining has yielded lithiated NiO of over 60 m2 g–1. DTA, conductivity measurements and chemical analyses confirmed that under these conditions, very uniform mixing between Li2O and NiO is achieved and that Li2O can diffuse into the NiO lattice at about 400° C, as compared to 950 to 1000° C for products prepared by conventional means.
Keywords:
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