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TFT LCD常见点缺陷的检测与修复
引用本文:黄雅纹,陈再良. TFT LCD常见点缺陷的检测与修复[J]. 现代电子技术, 2012, 35(23): 189-191
作者姓名:黄雅纹  陈再良
作者单位:1. 惠州学院建筑与土木工程系,广东惠州,516007
2. 苏州大学机电学院,江苏苏州,215021
摘    要:
TFT—LCD在制程中会产生亮点、暗点、闪点、碎亮点等常见点缺陷。说明了检测点缺陷的装置、方法和过程。采用ITO隔离、激光炸射等方法对点缺陷进行修复或者淡化,其中ITO隔离法修复或淡化效果显著。修复成功率从45%提升到80%。

关 键 词:TFT—LCD  点缺陷  检测  激光修复

Detection and repair of point defects in TFT LCD
HUANG Ya-wen , CHEN Zai-liang. Detection and repair of point defects in TFT LCD[J]. Modern Electronic Technique, 2012, 35(23): 189-191
Authors:HUANG Ya-wen    CHEN Zai-liang
Affiliation:1.Department of Architecture and Civil Engineering,Huizhou University,Huizhou 516007,China; 2.School of Mechanical and Electrical Engineering,Soochow University,Suzhou 215021,China)
Abstract:
The point defects such as bright points, dark points, flash points and broken bright point that often occur in the process of TFT-LCD production are analyzed. The device, method and process of the poinl defects detection are ex- plained. The point defects are detected and repaired by using bomb and ITO insulation. Among them, ITO insulation is most effective in repairing the defects. The success rate of point defects repairing is improved from 450A to 80%.
Keywords:TFT-LCD point defect detection  laser repair
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