首页 | 本学科首页   官方微博 | 高级检索  
     


Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits
Authors:Yukiya Miura  Shuichi Seno
Affiliation:(1) Graduate School of Engineering, Tokyo Metropolitan University, Tokyo, 192-0397, Japan
Abstract:
In this paper we analyze fault behaviors of internal feedback bridging faults. To investigate their behaviors, we use a simple circuit model consisting of 2-input NAND gate and NOT gate. From analysis results, we find that behaviors of internal feedback bridging faults are more complex than those of external feedback bridging faults. We expose that they cause IDDQ-only failure, internal latch and internal oscillation as well as latch and oscillation behavior. These phenomena are caused by the following facts: formation of an electrically conducting feedback loop and connection of the feedback loop with the circuit output depend on input values of the circuit, and the feedback loop is often alive only within the circuit. We also discuss methods for detecting this kind of fault.
Keywords:CMOS circuits  fault analysis  fault behavior  feedback bridging faults  IDDQ testing
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号