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Scanning transmission electron microscopy imaging dynamics at low accelerating voltages |
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| Authors: | Lugg N R Findlay S D Shibata N Mizoguchi T D'Alfonso A J Allen L J Ikuhara Y |
| Affiliation: | a School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia b Institute of Engineering Innovation, The University of Tokyo, Tokyo 116-0013, Japan c PRESTO, Japan Science and Technology Agency, Saitama 332-0012, Japan d Institute of Industrial Science, The University of Tokyo, Tokyo 153-8505, Japan e Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587, Japan f WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan |
| Abstract: | |
| Keywords: | Low accelerating voltages Scanning transmission electron microscopy (STEM) High-angle annular dark field (HAADF) Electron energy-loss spectroscopy (EELS) Annular bright field (ABF) |
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