Voltage divider resistance for high-resolution of the thermistor temperature measurement |
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Authors: | Jongwon Kim Jong Dae Kim |
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Affiliation: | aBiomedLab Co., Ltd., 7F, Gayang-Dong, Gangseo-Gu, 143-813 Seoul, Republic of Korea;bDivision of Information and Communication Engineering, Hallym University, 1 Okchon-dong, Chunchon 200-702, Republic of Korea |
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Abstract: | When measuring temperature with a voltage divider, and changing the variation of the thermistor resistance from the temperature to the voltage, the divider resistance greatly impacts the resolution of each ADC step. This work presents a method for determining the divider resistance to minimize the resolution’s maximum value in a given temperature range. Since the function of the resolution strongly depends on the derivative of the thermistor resistance, we also investigated the effect on the resolution when the derivative was calculated by forward and backward finite differences and the Stein–Hart calibration equation. The results showed that the resolution’s maximum calculated by the three methods had only a 5% difference, for the four types of commonly used NTC thermistors. Also, we demonstrated that the divider resistance which minimizes the interval resolution’s maximum can be determined by the thermistor resistance and its derivative at each end of the temperature range. |
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Keywords: | Negative Temperature Coefficient (NTC) thermistor Temperature measurement Voltage divider resistance High-resolution |
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