首页 | 本学科首页   官方微博 | 高级检索  
     

基于否定选择遗传算法的路径覆盖测试数据生成
引用本文:夏春艳,张岩,万里,宋妍,肖楠,郭冰.基于否定选择遗传算法的路径覆盖测试数据生成[J].电子学报,2019,47(12):2630-2638.
作者姓名:夏春艳  张岩  万里  宋妍  肖楠  郭冰
作者单位:牡丹江师范学院计算机与信息技术学院,黑龙江牡丹江,157012;天津大学智能与计算学部,天津,300350
基金项目:基本科研业务费项目;牡丹江师范学院科学技术研究;牡丹江师范学院科学技术研究;黑龙江省自然科学基金;黑龙江省教育厅;黑龙江省教育厅;黑龙江省教育厅;科技计划;科技计划;创新训练项目
摘    要:路径覆盖是软件测试领域重要的测试方法之一.在搜索空间中,找到一组测试数据满足路径覆盖是一个具有挑战性的问题.因此,自动生成测试数据是软件测试的关键问题.文中提出一种基于否定选择遗传算法的路径覆盖测试数据生成方法,将否定选择策略融入遗传算法,动态优化遗传算法的种群数据,自动生成覆盖目标路径的测试数据.多个基准程序和工业程序的实验结果表明,与随机方法和遗传算法比较,文中方法能够提高路径覆盖率,减少冗余测试数据的生成.

关 键 词:软件测试  遗传算法  否定选择  路径覆盖  测试数据
收稿时间:2018-08-20

Test Data Generation of Path Coverage Based on Negative Selection Genetic Algorithm
XIA Chun-yan,ZHANG Yan,WAN Li,SONG Yan,XIAO Nan,GUO Bing.Test Data Generation of Path Coverage Based on Negative Selection Genetic Algorithm[J].Acta Electronica Sinica,2019,47(12):2630-2638.
Authors:XIA Chun-yan  ZHANG Yan  WAN Li  SONG Yan  XIAO Nan  GUO Bing
Affiliation:1. School of Computer and Information Technology, Mudanjiang Normal University, Mudanjiang, Heilongjiang 157012, China; 2. Tianjin University Division of Intelligence and Computing, Tianjin University, Tianjin 300350, China
Abstract:Path coverage is one of the most important testing methods in the field of software testing.It is a challenging problem to find a set of test data to satisfy the path coverage in the search space.Therefore,automatically generating test data is a key issue in software testing.In this paper,a generation method of test data based on the negative selection genetic algorithm is proposed.The negative selection strategy is integrated into the genetic algorithm,and the population data of the genetic algorithm is dynamically optimized,and the test data covering the target path is automatically generated.The experimental results show that compared with the random method and the genetic algorithm,the proposed method can improve the path coverage and reduce the generation of redundant test data.
Keywords:software test  genetic algorithm  negative selection  path coverage  test data  
本文献已被 万方数据 等数据库收录!
点击此处可从《电子学报》浏览原始摘要信息
点击此处可从《电子学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号