大尺寸硅片超精密磨削平整化加工机理与技术

在中国国家自然科学基金重大项目《先进电子制造中的重要科学技术问题研究》资助下，针对大尺寸硅片化学机械抛光(CMP)和超精密磨削平整化所涉及的“超精抛光中纳米粒子行为和化学作用及平整化原理与技术”，以300mm硅片为代表，归纳报告硅片超精密磨削加工机理、磨削平整化理论、超精密磨削表面/亚表面损伤、磨削加工工艺规律，以及大尺寸硅片超精密磨削平整化加工关键技术的研究进展。 从硅片旋转磨削过程的运动学仿真、硅片磨削过程的分子动力学仿真和硅片材料的脆性 延性转变等3方面研究了硅片的超精密磨削机理。 通过建立硅片旋转磨削过程的运动学理论模型，获得硅片旋转磨削的运动轨迹参数方程、磨纹长度、磨纹数量以及磨削稳定周期等模型，分析了磨纹间距、磨纹密度与磨削表面层质量的关系。在此基础上开发硅片旋转磨削纹理的计算机预测仿真软件对硅片超精密磨削过程进行数字模拟，通过硅片磨削实验对数字仿真结果进行实验验证。

Machining Mechanism and Technology of Ultra precision Grinding based

this research is funded by the Study on the Key Scientific and Technological Issues in the Process of Advanced Electronic Manufacturing of NSFC. The Behavior of Nanometer Particle and Chemical Effect and Leveling Principle and Technology in the Process of Super Fine Polishing involved in machining mechanism and technology of chemical mechanical polishing (CMP) and ultra-precision grinding of large size silicon wafers is systemically investigated. Mechanism of ultra precision grinding of large size silicon wafers is investigated systemically through kinematics simulation of the wafer rotation grinding, molecular dynamics simulation of the wafer grinding process and analyses of brittle to ductile transition for single crystal silicon.