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正电子湮没无损测试技术与应用
引用本文:许占显.正电子湮没无损测试技术与应用[J].无损检测,2013(11):72-75,86.
作者姓名:许占显
作者单位:广东环境保护工程职业学院机电工程系,佛山528216
摘    要:介绍了一种探测和表征物质微观结构的技术——正电子湮没无损测试技术。该技术可用于固体物理晶体缺陷、材料相结构与相结构转变的研究,是一种研究物质微观结构、缺陷、疲劳等的无损测试新技术。根据该技术与方法的固有特征,判定该技术在飞机、导弹质量控制中极具有发展和应用前景。

关 键 词:正电子湮没  疲劳  微观  无损检测

Positive Electron Annihilation Nondestructive Measurement Technique and Application
XU Zhan-Xian.Positive Electron Annihilation Nondestructive Measurement Technique and Application[J].Nondestructive Testing,2013(11):72-75,86.
Authors:XU Zhan-Xian
Affiliation:XU Zhan-Xian (Guangdong Enviromental Protection Engineering of Career Academy, Departmen of Electrical and Mechanical Engineering, Foshan 528216, China)
Abstract:The positive electron annihilation nondestructive measurement technique is a kind of researching method for token and probing into of microcosmic material structure, and it is used for researching solid physical crystal blemish, material lattice structure and its structure change mutually. The technique has become a kind of new research means for microcosmic material structure, flaw, fatigue etc. According to its inherent characteristic, it is proposed that the technique is a kind of developing prospect of nondestructive evaluation ways for estimating airplane and guided missile fatigue.
Keywords:Positive electron annihilation  Fatigue  Microcosmic  Nondestructive testing
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