基于X射线的小麦三维精准模型的构建

利用X射线断层扫描显微成像技术完成了整个小麦籽粒精准模型的构建,准确将小麦胚乳、胚芽及果皮部分区分出来,统计并计算了小麦各部分体积含量和相对表面积。这些参数和模型,可以作为计算小麦基本物理参数如外形尺寸﹑密度﹑孔隙率等的依据,可以用于小麦在农业机械设备中的颗粒碰撞,流固耦合等的运动仿真模型。小麦精准模型的构建对于粮食科学的发展应用具有重要意义。

Construction of three-dimensional model of wheat based on x-ray microtomography

In this paper, the X-ray microtomography technique was used to complete the whole wheat grain precision model building and to distinguish the wheat endosperm, germ and bran . We calculated the volume content of each part and relative surface area of wheat. These parameters and models can be used as the basis to calculate the basic physical parameters of wheat, Such as shape, density and porosity, and so on. They can be used to simulate the grain collision and fluid-structure coupling of wheat in agricultural machinery and equipment. The construction of wheat precise model is of great significance to the development and application of food science.