Aberration‐corrected STEM for atomic‐resolution imaging and analysis |
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Authors: | OL KRIVANEK TC LOVEJOY N DELLBY |
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Affiliation: | 1. Nion Co., Kirkland, Washington, U.S.A.;2. Department of Physics, Arizona State University, Tempe, Arizona, U.S.A. |
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Abstract: | Aberration‐corrected scanning transmission electron microscopes are able to form electron beams smaller than 100 pm, which is about half the size of an average atom. Probing materials with such beams leads to atomic‐resolution images, electron energy loss and energy‐dispersive X‐ray spectra obtained from single atomic columns and even single atoms, and atomic‐resolution elemental maps. We review briefly how such electron beams came about, and show examples of applications. We also summarize recent developments that are propelling aberration‐corrected scanning transmission electron microscopes in new directions, such as complete control of geometric aberration up to fifth order, and ultra‐high‐energy resolution EELS that is allowing vibrational spectroscopy to be carried out in the electron microscope. |
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Keywords: | Aberration correction electron energy loss spectroscopy electron monochromator energy‐analyzed Rutherford scattering energy‐dispersive X‐ray spectroscopy high‐order aberrations monochromated electron beams scanning transmission electron microscopy (STEM) vibrational spectroscopy |
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