Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope |
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| Authors: | M R Vanlandingham S H McKnight G R Palmese J R Elings X Huang T A Bogetti R F Eduljee J W Gillespie Jr |
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| Affiliation: |
a Center for Composite Materials and Materials Science Program, University of Delaware, Newark, DE, USA
b Army Research Laboratory, Weapons and Materials Research Directorate, Aberdeen Proving Ground, MD, USA
c Center for Composite Materials, University of Delaware, Newark, DE, USA
d Digital Instruments, Santa Barbara, CA, USA |
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| Abstract: | The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N m were used to investigate a number of polymer systems, including an elastomer, several polyurethane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite. |
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| Keywords: | Atomic force microscope force curves indentation elastic modulus polymers elastomer polyurethane epoxy fiber-reinforced polymer composite interphase regions |
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