X射线荧光光谱在标准物质和标准方法研究中的应用评介

标准物质研制需要多种高精密度、高准确度方法的综合运用,特别是样品粉碎加工后的均匀性和稳定性检验,更特别强调检测方法的高精密度测量。X射线荧光光谱(XRF)技术是当今地质材料主、次量组分精密度最高、最经济快速、无污染的多元素分析技术,因此在地质标准物质研制中应用广泛并发挥了重要作用。文章从样品均匀性、稳定性、多元素定值分析和标准分析方法制定方面评介了XRF在地质标准物质研制中的应用,也介绍了XRF在国家和行业标准分析方法制定中的应用。特别介绍了XRF在进行均匀性检验实践中的重要发现:样品不均匀误差已成为现代地质分析误差的重要来源,并从地质分析样品粒度随分析技术进步而不断减小的历史演变提出了应进一步降低分析样品(包括标准物质)粒度的建议,使其与XRF、电感耦合等离子体原子发射光谱(ICP-AES)和电感耦合等离子体质谱(ICP-MS)这些当今最重要的现代分析技术相适应。此外,还评介了超细标准物质研制与超细样品分析方面的研究工作,简述了该项研究的意义和可能对整个地质分析发展带来的影响。美国国家标准与技术研究院(NIST)在这方面的研究工作标志着超细标准物质研制和超细样品分析将是地质分析发展的一个重要方向。全篇引文125篇。

Review on the application of X-ray fluorescence spectrometry in geological reference materials and standard methods

The development of reference materials required the comprehensive applications of various high-precision and high-accuracy methods, especially the homogeneity and stability test after sample grinding, and the high-precision of the analytical method. X-ray fluorescence spectrometry (XRF) was the most accurate analytical method for the major and minor components of geological materials, and it was a non-polluting multi-element analysis method, so it was widely used in the development of geological reference materials and played an important role. The paper reviewed the applications of XRF in the development of geological reference materials from the aspects of sample uniformity, stability, multi-element constant value analysis and standard analysis method formulation, and also introduced the application of XRF in the formulation of national and industrial standard analysis. The paper especially introduced the important discovery of XRF in the testing of homogeneity, and the non-uniformity error of samples had become an important source of modern geological analysis error, and put forward to reduce the particle size of samples (including reference materials) from the historical evolution that the particle size of geological analysis samples decreased with the progress of analysis technology. So that it could be adapted to these techniques, such as XRF, inductively coupled plasma atomic emission spectrometry (ICP-AES)/inductively coupled plasma mass spectrometry (ICP-MS). The paper also reviewed the research work on the development of ultra-fine reference materials and the analysis of ultra-fine samples, and briefly described the significance of the research and its possible impact on the development of the whole geological analysis. The research work of NIST in this field indicated that the development of superfine reference materials and the analysis of superfine samples would be an important direction in the development of geological analysis. There were 125 citations in the paper.