High speed SOI CMOS image sensor with pinned photodiode on handle wafer |
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Authors: | Yong-Soo Cho K. Sawada Sie-Young Choi |
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Affiliation: | a School of Electronic and Electrical Engineering, Kyungpook National University, 1370 Sankyuk-dong, Buk-gu, Daegu 702-701, South Korea b Department of Electrical and Electronic Engineering, Toyohashi University of Technology, Toyohashi 441-8580, Japan |
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Abstract: | We have fabricated SOI CMOS active pixel image sensor with pinned photodiode on handle wafer. The structure of one pixel is a four-transistor type active pixel image sensor, which consists of a reset and a source follower transistor on seed wafer, and is comprised of a photodiode, a transfer gate, and a floating diffusion on handle wafer. The photodiode could be optimized for better quantum efficiency and low dark currents because the process of a photodiode on handle wafer is independent of that of transistors on seed wafer. Most of the wavelengths are absorbed within the visible range, because the optimized photodiode is located on the handle wafer. The response time of SOI CMOS active pixel sensor was about 2 times faster than that of bulk CMOS active pixel image sensor. |
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Keywords: | SOI CMOS image sensor Cis High speed Pinned photodiode Low dark current |
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