High dielectric and microwave absorption properties of ultra-thin 1-xSrTiO3-δ − xSrAl12O19 films |
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| Authors: | Qinlong Wen Wancheng Zhou Hui Gao Yingying Zhou Fa Luo Dongmei Zhu Zhibin Huang Yuchang Qing |
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| Affiliation: | 1. State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi′an 710072, China;2. School of Materials Engineering, Xi’an Aeronautical University, Xi′an 710077, China |
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| Abstract: | To reduce the thickness of the microwave absorbing materials, we have prepared 1-xSrTiO3-δ?xSrAl12O19 ceramics by hot?pressing sintering in the vacuum. The microstructure, dielectric, thermogravimetric analysis and microwave absorbing properties of 1-xSrTiO3-δ?xSrAl12O19 were systematically investigated and discussed. The 0.95SrTiO3-δ??0.05SrAl12O19 has high permittivity, the real part is from 1662.2 to 704.9 and the imaginary part is from 208.6 to 12. The absorption bandwidth (reflection loss ≤?5?dB) of 0.95SrTiO3-δ??0.05SrAl12O19 can cover 8.6???12.4?GHz and its thickness is only 0.232?mm which is much thinner than these recently reported by other researchers. For 0.942SrTiO3-δ??0.058SrAl12O19, the peak value of reflection loss is up to ??58.5?dB with a thickness of 0.75?mm. The 1-xSrTiO3-δ?xSrAl12O19 films could be excellent candidates for highly efficient and ultra?thin microwave absorbing materials. |
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| Keywords: | Ultra?thin Permittivity Microwave absorption |
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