基于变周期重播种LFSR的测试生成

基于重播种的LFSR结构的伪随机测试生成中包含的冗余测试序列较多,因而其测试序列长度仍较长,耗费测试时间长,测试效率不高。针对此状况,提出基于变周期重播种的LFSR结构的测试生成方法。该方法可以有效地跳过伪随机测试生成中的大量冗余测试序列。在保证电路测试故障覆盖率不变的条件下,缩短总测试序列的长度。分析结果表明,同定长重播种方法相比,该方法能以较少的硬件开销实现测试序列的精简,加快了测试的速度,提高了电路测试诊断的效率。

Test Pattern Generation Based on Variable-Cycle Reseeding LFSR Structure

Test pattern generation based on the reseeding LFSR structure contains many redundant test sequences,thus the length of test sequence is long,much test time is wasted and the efficiency is low.To solve this problem,test pattern generation based on variable-cycle reseeding LFSR structure was proposed.The redundant test pattern can be skipped in the random test pattern generation.The length of test sequence can be shorten in the condition of ensuring circuit test fault coverage.Compared with fixed-length reseeding test pattern generation,this method can simplify the test sequence,accelerate test speed,and improve circuit testing diagnostic efficiency with less hardware cost.