Average run lengths of a control chart based on the sum of squared errors |
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Authors: | Chi-hyuck Jun Moon Soo Choi |
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Affiliation: | Department of Industrial Engineering Pohang University of Science and Technology San 31 Hyoja-dong, Pohang 790-784, Korea |
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Abstract: | A new control chart is proposed for the purpose of controlling both process mean and variability simultaneously, which is based on the sum of squared errors within a subgroup. Theoretical average run lengths are derived and numerically solved for given process changes in mean and variability. It is compared with
control charts and s2 control charts in terms of the average run lengths. |
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Keywords: | process change mean variability sum of squared errors average run length chi-square distribution |
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