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Average run lengths of a control chart based on the sum of squared errors
Authors:Chi-hyuck Jun  Moon Soo Choi
Affiliation:

Department of Industrial Engineering Pohang University of Science and Technology San 31 Hyoja-dong, Pohang 790-784, Korea

Abstract:A new control chart is proposed for the purpose of controlling both process mean and variability simultaneously, which is based on the sum of squared errors within a subgroup. Theoretical average run lengths are derived and numerically solved for given process changes in mean and variability. It is compared with control charts and s2 control charts in terms of the average run lengths.
Keywords:process change   mean   variability   sum of squared errors   average run length   chi-square distribution
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