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角度位置自动识别的红外折射率测量
引用本文:刘永兴,戴世勋,张培晴,吴越豪,胡向平.角度位置自动识别的红外折射率测量[J].光学精密工程,2018,26(2):300-306.
作者姓名:刘永兴  戴世勋  张培晴  吴越豪  胡向平
作者单位:1. 宁波大学 高等技术研究院 红外材料及器件实验室, 浙江 宁波 315211;2. 湖北新华光信息材料有限公司, 湖北 襄阳 441000;3. 浙江省光电探测材料及器件重点实验室, 浙江 宁波 315211
基金项目:国家重点研发计划资助项目(No.2016YFB0303800);国家基金委重大科学仪器项目(No.61627815);宁波大学王宽诚幸福基金
摘    要:为准确快速获得块体硫系玻璃红外波段的折射率,搭建了基于类准直测量法的折射率测量系统。该系统采用液氮制冷的碲镉汞探测器和特殊的光路实现了光强信息的高分辨采集,使用高分辨数据采集卡将角度信息数字化,利用精密步进电机传动控制系统实现了光强信号与位置信号的同步记录。开发的测量软件可自动判别光强峰位信息,自动计算获得待测样品的折射率。对比测试Ge_(20)Sb_(15)Se_(65)、Ge_(28)Sb_(12)Se_(60)、As_2S_3和As_2Se_3商用硫系玻璃在3.39μm和4.8μm处的折射率。实验结果表明,该装置系统测量折射率的标准偏差为10~(-3),测量不确定度为0.002 9,可快速、准确测量块体材料红外波段的折射率。

关 键 词:红外光学材料  硫系玻璃  折射率测量  自准直法
收稿时间:2017-06-27

Measurement of infrared refractive index based on angle location automatic recognition
LIU Yong-xing,DAI Shi-xun,ZHANG Pei-qing,WU Yue-hao,HU Xiang-ping.Measurement of infrared refractive index based on angle location automatic recognition[J].Optics and Precision Engineering,2018,26(2):300-306.
Authors:LIU Yong-xing  DAI Shi-xun  ZHANG Pei-qing  WU Yue-hao  HU Xiang-ping
Affiliation:1. Laboratory of Infrared Materials and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;2. Hu Bei New Hua Guang Information Matreials CO., Ltd., Xiangyang 441000, China;3. Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China
Abstract:In order to determine the refractive index of bulk glasses in the infrared band, a refractive index measurement system based on the optical auto-collimation principle is proposed. We use a liquid-nitrogen-cooled mercury telluride detector and a special optical architecture to collect high-resolution light intensity information. The angle information is converted to digital information by a data acquisition card. A precision stepper motor drive control system is used to synchronize the light intensity signal and the position signal. The software automatically determines the peak position of the light intensity, and automatically calculates the refractive index of the sample. The refractive indices of the Ge20Sb15Se65, Ge28Sb12Se60, As2S3 and As2Se3 commercial chalcogenide glasses were measured at 3.39 μm and 4.8 μm. The standard deviation of the refractive index measurement system is 10-3 with a measurement uncertainty of 0.002 9. The system can be useful to quickly and accurately measure the refractive index of bulk materials in the infrared band.
Keywords:infrared optical materials  chalcogenide glass  refractive index measurement  autocollimation refractometric method
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