首页 | 本学科首页   官方微博 | 高级检索  
     

Mach—Zehnder干涉仪法测定染料掺杂高聚物薄膜复数电光系数
引用本文:程晓曼.Mach—Zehnder干涉仪法测定染料掺杂高聚物薄膜复数电光系数[J].光电子.激光,1998,9(2):129-133.
作者姓名:程晓曼
作者单位:天津理工学院光电信息与电子工程系
摘    要:本文介绍了一种使用Mach-Zehnder干涉仪同时测定染料掺杂高聚物薄膜电系数张量实部和虚部的方法,用该方法测量了掺染料1号(DR1)有机玻璃到(PMMA)膜的复数电光系数张量分量r13和r33并讨论了膜内多重反射效应对测量精度的影响,给出了修正公式和实验结果。

关 键 词:染料掺杂  高聚物  复数电光系数  干涉仪  测定

Measurement of the Complex Electro Optic (EO) Tensor of Dye doped Polymer Films with a Mach Zehnder Interferometer
Cheng,Xiaoman.Measurement of the Complex Electro Optic (EO) Tensor of Dye doped Polymer Films with a Mach Zehnder Interferometer[J].Journal of Optoelectronics·laser,1998,9(2):129-133.
Authors:Cheng  Xiaoman
Abstract:In this paper,a method for the determination of the complex tensor components (real and imaginay parts) of electro optic contants of dye doped polymer films is used by a Mach Zehnder interferometer.With this method,the complex electro optic tensors of disperse red 1 (DR1) dye molecules doped in polymethylmethacrylate (PMMA) films were measured.The influence of multiple reflections in polymer film on the experimental results is discussed and corrected.
Keywords:dye  doped  polymer  complex  electro  optic  constant  tensor  Mach  Zehnder  interferometer  
本文献已被 CNKI 维普 等数据库收录!
点击此处可从《光电子.激光》浏览原始摘要信息
点击此处可从《光电子.激光》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号